In vitro early proximal caries detection using trilateral short-wave infrared reflection at 1050 and 1550 nm.
X-ray microtomography
dental caries
diagnostic imaging
sensitivity and specificity
short-wave infrared reflection
Journal
Dento maxillo facial radiology
ISSN: 1476-542X
Titre abrégé: Dentomaxillofac Radiol
Pays: England
ID NLM: 7609576
Informations de publication
Date de publication:
28 Sep 2024
28 Sep 2024
Historique:
received:
10
06
2024
revised:
21
08
2024
accepted:
31
08
2024
medline:
28
9
2024
pubmed:
28
9
2024
entrez:
28
9
2024
Statut:
aheadofprint
Résumé
This in vitro study evaluated the diagnostic potential of short-wave infrared reflection (SWIRR) at 1050 and 1550 nm for proximal caries detection from the occlusal, buccal and lingual surfaces of posterior teeth under clinically relevant conditions. Bitewing radiography (BWR) was the alternative index test and micro-computed tomography (μCT) the reference standard. 250 proximal surfaces of extracted human teeth were examined using SWIRR at 1050 and 1550 nm and BWR. SWIRR, BWR and μCT findings were evaluated twice by two trained examiners. SWIRR images were evaluated from occlusal and trilateral (occlusal, buccal and lingual combined) views. Sensitivity, specificity and AUC were calculated. Reliability assessment was performed using κ statistics. SWIRR (1050 nm) showed sensitivity of 0.44 for occlusal and 0.55 for trilateral assessment, paired with specificity of 0.96 and 0.90, whereas SWIRR (1550 nm) showed sensitivity of 0.73 and 0.85 paired with specificity of 0.76 and 0.59. Compared to occlusal view, trilateral SWIRR view revealed ≈10% higher sensitivity and lower specificity. BWR revealed lowest sensitivity (0.30) and highest specificity (0.99). Over-and underestimation of caries demonstrated opposite trends: from 1050-1550 nm, overestimation of trilateral SWIRR increased (0.08-0.29), while underestimation decreased (0.15-0.06). Trilateral SWIRR has higher sensitivity and lower specificity for proximal caries, than occlusal SWIRR. 1050 nm are more suitable for trilateral SWIRR and 1550 nm for occlusal examinations. A combination of SWIRR at 1050 and 1550 nm may exhibit a balanced sensitivity and specificity for proximal caries.
Identifiants
pubmed: 39340805
pii: 7789471
doi: 10.1093/dmfr/twae049
pii:
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Informations de copyright
© The Author(s) 2024. Published by Oxford University Press on behalf of the British Institute of Radiology and the International Association of Dentomaxillofacial Radiology. All rights reserved. For permissions, please email: journals.permissions@oup.com.