Mechanisms of Defect-Mediated Memristive Behavior in MoS

2D materials first-principles calculations memristors point defects quantum transport resistance switching

Journal

Nano letters
ISSN: 1530-6992
Titre abrégé: Nano Lett
Pays: United States
ID NLM: 101088070

Informations de publication

Date de publication:
03 Oct 2024
Historique:
medline: 4 10 2024
pubmed: 4 10 2024
entrez: 3 10 2024
Statut: aheadofprint

Résumé

The switching dynamics of a Au∥V

Identifiants

pubmed: 39361515
doi: 10.1021/acs.nanolett.4c03792
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Auteurs

Yuefei Huang (Y)

Department of Materials Science and NanoEngineering, Rice University, Houston, Texas 77005, United States.

Evgeni S Penev (ES)

Department of Materials Science and NanoEngineering, Rice University, Houston, Texas 77005, United States.

Boris I Yakobson (BI)

Department of Materials Science and NanoEngineering, Rice University, Houston, Texas 77005, United States.

Classifications MeSH