Thermo-Convective Solution Growth of Vertically Aligned Zinc Oxide Nanowire Arrays for Piezoelectric Energy Harvesting.

Raman spectroscopy XRD ZnO nanowire arrays piezoelectric energy harvesting seed layer thermo-convective solution growth

Journal

Micromachines
ISSN: 2072-666X
Titre abrégé: Micromachines (Basel)
Pays: Switzerland
ID NLM: 101640903

Informations de publication

Date de publication:
24 Sep 2024
Historique:
received: 31 07 2024
revised: 26 08 2024
accepted: 17 09 2024
medline: 26 10 2024
pubmed: 26 10 2024
entrez: 26 10 2024
Statut: epublish

Résumé

The search for a synthesis method to create longer ZnO NWAs with high-quality vertical alignment, and the investigation of their electrical properties, have become increasingly important. In this study, a hydrothermal method for growing vertically aligned arrays of ZnO nanowires (NWs) using localized heating was utilized. To produce longer NWs, the temperature environment of the growth system was optimized with a novel reaction container that provided improved thermal insulation. At a process temperature above ~90 °C, ZnO NWs reached a length of ~26.8 µm within 24 h, corresponding to a growth rate of 1.1 µm/h, nearly double the rate of 0.6 µm/h observed in traditional chemical bath growth using a glass reactor. The densely grown NWs (~1.9/µm

Identifiants

pubmed: 39459053
pii: mi15101179
doi: 10.3390/mi15101179
pii:
doi:

Types de publication

Journal Article

Langues

eng

Subventions

Organisme : European Union's Horizon 2020
ID : 19ENG05 Nanowires

Auteurs

Frank Eric Boye Anang (FEB)

Institute of Semiconductor Technology, Technische Universität Braunschweig, 38106 Braunschweig, Germany.
Scientific Metrology Department, Ghana Standards Authority (GSA), Accra P.O. Box MB 245, Ghana.

Andam Deatama Refino (AD)

Institute of Semiconductor Technology, Technische Universität Braunschweig, 38106 Braunschweig, Germany.

Gunilla Harm (G)

Institute of Semiconductor Technology, Technische Universität Braunschweig, 38106 Braunschweig, Germany.

Defang Li (D)

Institute of Semiconductor Technology, Technische Universität Braunschweig, 38106 Braunschweig, Germany.

Jiushuai Xu (J)

Institute of Semiconductor Technology, Technische Universität Braunschweig, 38106 Braunschweig, Germany.

Markys Cain (M)

Electrosciences Ltd., Farnham GU9 9QT, Surrey, UK.

Uwe Brand (U)

Surface Metrology Department, Physikalisch-Technische Bundesanstalt (PTB), 38116 Braunschweig, Germany.

Zhi Li (Z)

Surface Metrology Department, Physikalisch-Technische Bundesanstalt (PTB), 38116 Braunschweig, Germany.

Marion Görke (M)

Institute for Particle Technology, Technische Universität Braunschweig, 38104 Braunschweig, Germany.

Georg Garnweitner (G)

Institute for Particle Technology, Technische Universität Braunschweig, 38104 Braunschweig, Germany.
Laboratory for Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany.

Erwin Peiner (E)

Institute of Semiconductor Technology, Technische Universität Braunschweig, 38106 Braunschweig, Germany.
Laboratory for Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany.

Classifications MeSH