Recent Progress of Imaging Chemical Bonds by Scanning Probe Microscopy: A Review.

BR-STM/nc-AFM technique Bond imaging CO-functionalized tip halogen bond hydrogen bond molecular self-assembly on-surface synthesis organic molecules tip manipulation

Journal

ACS nano
ISSN: 1936-086X
Titre abrégé: ACS Nano
Pays: United States
ID NLM: 101313589

Informations de publication

Date de publication:
30 Oct 2024
Historique:
medline: 30 10 2024
pubmed: 30 10 2024
entrez: 30 10 2024
Statut: aheadofprint

Résumé

In the past decades, the invention of scanning probe microscopy (SPM) as the versatile surface-based characterization of organic molecules has triggered significant interest throughout multidisciplinary fields. In particular, the bond-resolved imaging acquired by SPM techniques has extended its fundamental function of not only unraveling the chemical structure but also allowing us to resolve the structure-property relationship. Here, we present a systematical review on the history of chemical bonds imaged by means of noncontact atomic force microscopy (nc-AFM) and bond-resolved scanning tunneling microscopy (BR-STM) techniques. We first summarize the advancement of real-space imaging of covalent bonds and the investigation of intermolecular noncovalent bonds. Beyond the bond imaging, we also highlight the applications of the bond-resolved SPM techniques such as on-surface synthesis, the determination of the reaction pathway, the identification of molecular configurations and unknown products, and the generation of artificial molecules created via tip manipulation. Lastly, we discuss the current status of SPM techniques and highlight several key technical challenges that must be solved in the coming years. In comparison to the existing reviews, this work invokes researchers from surface science, chemistry, condensed matter physics, and theoretical physics to uncover the bond-resolved SPM technique as an emerging tool in exploiting the molecule/surface system and their future applications.

Identifiants

pubmed: 39475528
doi: 10.1021/acsnano.4c10522
doi:

Types de publication

Journal Article Review

Langues

eng

Sous-ensembles de citation

IM

Auteurs

Dingguan Wang (D)

State Key Laboratory of Radio Frequency Heterogeneous Integration (Shenzhen University), Shenzhen Key Laboratory of Semiconductor Heterogeneous Integration Technology, College of Electronics and Information Engineering, Shenzhen University, Shenzhen 518060, China.
Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore 117551, Singapore.

Tobias Haposan (T)

Center of Excellence Applied Physics and Chemistry, Nano Center Indonesia, South Tangerang 15314, Indonesia.

Jinwei Fan (J)

State Key Laboratory of Radio Frequency Heterogeneous Integration (Shenzhen University), Shenzhen Key Laboratory of Semiconductor Heterogeneous Integration Technology, College of Electronics and Information Engineering, Shenzhen University, Shenzhen 518060, China.
Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore 117551, Singapore.
Center of Excellence Applied Physics and Chemistry, Nano Center Indonesia, South Tangerang 15314, Indonesia.

Andrew T S Wee (ATS)

Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore 117551, Singapore.
Centre for Advanced 2D Materials and Graphene Research Centre, National University of Singapore, 6 Science Drive 2, Singapore 117546, Singapore.

Classifications MeSH