G D Cole

Publications (1)

Thickness uniformity measurements and damage threshold tests of large-area GaAs/AlGaAs crystalline coatings for precision interferometry.

Optics express

Avec: P Koch , G D Cole , C Deutsch , D Follman , P Heu , M Kinley-Hanlon , R Kirchhoff , S Leavey , J Lehmann , P Oppermann , A K Rai , Z Tornasi , J Wöhler , D S Wu , T Zederbauer , H Lück

Réseau de co-auteurs

P Koch 1 collaboration

C Deutsch 1 collaboration

D Follman 1 collaboration

P Heu 1 collaboration

M Kinley-Hanlon 1 collaboration

R Kirchhoff 1 collaboration

S Leavey 1 collaboration

J Lehmann 1 collaboration

P Oppermann 1 collaboration

A K Rai 1 collaboration

Z Tornasi 1 collaboration

J Wöhler 1 collaboration

D S Wu 1 collaboration

T Zederbauer 1 collaboration

H Lück 1 collaboration