Omur E Dagdeviren

Affiliations

Department of Mechanical Engineering, École de Technologie Supérieure, University of Quebec, Montreal, Quebec H3C 1K3, Canada.

ORCID: 0000-0002-4881-9280

Publications (9)

Customization of an atomic force microscope for multidimensional measurements under environmental conditions.

The Review of scientific instruments

Avec: Bugrahan Guner , Simon Laflamme , Omur E Dagdeviren

Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy.

Sensors (Basel, Switzerland)

Avec: Omur E Dagdeviren , Yoichi Miyahara , Aaron Mascaro , Tyler Enright , Peter Grütter

Ergodic and Nonergodic Dynamics of Oxygen Vacancy Migration at the Nanoscale in Inorganic Perovskites.

Nano letters

Avec: Omur E Dagdeviren , Aaron Mascaro , Shuaishuai Yuan , Javad Shirani , Kirk H Bevan , Peter Grütter

The Effect of Photoinduced Surface Oxygen Vacancies on the Charge Carrier Dynamics in TiO

Nano letters

Avec: Omur E Dagdeviren , Daniel Glass , Riccardo Sapienza , Emiliano Cortés , Stefan A Maier , Ivan P Parkin , Peter Grütter , Raul Quesada-Cabrera

Confronting interatomic force measurements.

The Review of scientific instruments

Avec: Omur E Dagdeviren

Intercalation leads to inverse layer dependence of friction on chemically doped MoS

Nanotechnology

Avec: Ogulcan Acikgoz , Enrique Guerrero , Alper Yanilmaz , Omur E Dagdeviren , Cem Çelebi , David A Strubbe , Mehmet Z Baykara

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements.

Beilstein journal of nanotechnology

Avec: Aaron Mascaro , Yoichi Miyahara , Tyler Enright , Omur E Dagdeviren , Peter Grütter

Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensors.

The Review of scientific instruments

Avec: Omur E Dagdeviren , Yoichi Miyahara , Aaron Mascaro , Peter Grütter

Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance.

The Review of scientific instruments

Avec: Omur E Dagdeviren , Udo D Schwarz

Réseau de co-auteurs

Peter Grütter 5 collaborations

Aaron Mascaro 4 collaborations

Yoichi Miyahara 3 collaborations

Tyler Enright 2 collaborations

Bugrahan Guner 1 collaboration

Simon Laflamme 1 collaboration

Shuaishuai Yuan 1 collaboration

Javad Shirani 1 collaboration

Kirk H Bevan 1 collaboration

Daniel Glass 1 collaboration

Riccardo Sapienza 1 collaboration

Emiliano Cortés 1 collaboration

Stefan A Maier 1 collaboration

Ivan P Parkin 1 collaboration

Raul Quesada-Cabrera 1 collaboration

Ogulcan Acikgoz 1 collaboration

Enrique Guerrero 1 collaboration

Alper Yanilmaz 1 collaboration

Cem Çelebi 1 collaboration

David A Strubbe 1 collaboration

Mehmet Z Baykara 1 collaboration

Udo D Schwarz 1 collaboration