Grayscale Image Recognition Using Spike-Rate-Based Online Learning and Threshold Adjustment of Neurons in a Thin-Film Transistor-Type NOR Flash Memory Array.


Journal

Journal of nanoscience and nanotechnology
ISSN: 1533-4880
Titre abrégé: J Nanosci Nanotechnol
Pays: United States
ID NLM: 101088195

Informations de publication

Date de publication:
01 10 2019
Historique:
entrez: 28 4 2019
pubmed: 28 4 2019
medline: 10 6 2021
Statut: ppublish

Résumé

As a synaptic device, TFT-type NOR flash memory cell shows reasonable weight levels (50 levels for long-term potentiation (LTP) and 150 levels for long-term depression (LTD)) and large max/min ratio (═50) for synapse weight. Based on the measurement results of the synapse cell, supervised learning process is simulated using software MATLAB. A new pulse scheme is designed for mimicking spike-rate-dependent plasticity (SRDP) algorithm. Through learning and inferencing phase, our (784 × 100) network achieved 74.08% accuracy on the MNIST benchmark. A new method for adapting the threshold voltage of output neurons for firing is also proposed. This additional adjustment helps to eliminate the exclusive or dormant output neurons by setting the threshold voltage to an appropriate value proportional to the average weight of synapses connected to each neuron. As a result, accuracy increases to 82.54% in the (784 × 100) network and to 84.14% in the (784 × 200) network. Moreover, threshold adjustment helped the network to classify completely overlapped patterns in succession.

Identifiants

pubmed: 31026907
doi: 10.1166/jnn.2019.16995
doi:

Types de publication

Journal Article Research Support, Non-U.S. Gov't

Langues

eng

Sous-ensembles de citation

IM

Pagination

6055-6060

Auteurs

Seongbin Oh (S)

Department of Electrical and Computer Engineering, Seoul National University, Seoul 08826, Korea.

Chul-Heung Kim (CH)

Department of Electrical and Computer Engineering, Seoul National University, Seoul 08826, Korea.

Soochang Lee (S)

Department of Electrical and Computer Engineering, Seoul National University, Seoul 08826, Korea.

Byung-Gook Park (BG)

Department of Electrical and Computer Engineering, Seoul National University, Seoul 08826, Korea.

Jong-Ho Lee (JH)

Department of Electrical and Computer Engineering, Seoul National University, Seoul 08826, Korea.

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Classifications MeSH