Preparation of Graphene-Supported Microwell Liquid Cells for In Situ Transmission Electron Microscopy.


Journal

Journal of visualized experiments : JoVE
ISSN: 1940-087X
Titre abrégé: J Vis Exp
Pays: United States
ID NLM: 101313252

Informations de publication

Date de publication:
15 07 2019
Historique:
entrez: 30 7 2019
pubmed: 30 7 2019
medline: 30 5 2020
Statut: epublish

Résumé

The fabrication and preparation of graphene-supported microwell liquid cells (GSMLCs) for in situ electron microscopy is presented in a stepwise protocol. The versatility of the GSMLCs is demonstrated in the context of a study about etching and growth dynamics of gold nanostructures from a HAuCl4 precursor solution. GSMLCs combine the advantages of conventional silicon- and graphene-based liquid cells by offering reproducible well depths together with facile cell manufacturing and handling of the specimen under investigation. The GSMLCs are fabricated on a single silicon substrate which drastically reduces the complexity of the manufacturing process compared to two-wafer-based liquid cell designs. Here, no bonding or alignment process steps are required. Furthermore, the enclosed liquid volume can be tailored to the respective experimental requirements by simply adjusting the thickness of a silicon nitride layer. This enables a significant reduction of window bulging in the electron microscope vacuum. Finally, a state-of-the-art quantitative evaluation of single particle tracking and dendrite formation in liquid cell experiments using only open source software is presented.

Identifiants

pubmed: 31355798
doi: 10.3791/59751
doi:

Substances chimiques

Silicon Compounds 0
Gold 7440-57-5
Graphite 7782-42-5
Polymethyl Methacrylate 9011-14-7
silicon nitride QHB8T06IDK

Types de publication

Journal Article Research Support, Non-U.S. Gov't Video-Audio Media

Langues

eng

Sous-ensembles de citation

IM

Auteurs

Andreas Hutzler (A)

Electron Devices (LEB), Department of Electrical, Electronic and Communication Engineering, Friedrich-Alexander University Erlangen-Nürnberg; Andreas.Hutzler@leb.eei.uni-erlangen.de.

Birk Fritsch (B)

Electron Devices (LEB), Department of Electrical, Electronic and Communication Engineering, Friedrich-Alexander University Erlangen-Nürnberg.

Michael P M Jank (MPM)

Fraunhofer Institute for Integrated Systems and Device Technology (IISB).

Robert Branscheid (R)

Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), Department of Materials Science and Engineering, Friedrich-Alexander University Erlangen-Nürnberg.

Erdmann Spiecker (E)

Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), Department of Materials Science and Engineering, Friedrich-Alexander University Erlangen-Nürnberg.

Martin März (M)

Electron Devices (LEB), Department of Electrical, Electronic and Communication Engineering, Friedrich-Alexander University Erlangen-Nürnberg; Fraunhofer Institute for Integrated Systems and Device Technology (IISB); Power Electronics (LEE), Department of Electrical, Electronic and Communication Engineering, Friedrich-Alexander University Erlangen-Nürnberg.

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