Genetic algorithm search for the worst-case MRI RF exposure for a multiconfiguration implantable fixation system modeled using artificial neural networks.

RF-induced heating artificial neural network genetic algorithm magnetic resonant imaging safety specific absorption rate

Journal

Magnetic resonance in medicine
ISSN: 1522-2594
Titre abrégé: Magn Reson Med
Pays: United States
ID NLM: 8505245

Informations de publication

Date de publication:
11 2020
Historique:
received: 02 01 2020
revised: 20 03 2020
accepted: 21 04 2020
pubmed: 28 5 2020
medline: 15 5 2021
entrez: 28 5 2020
Statut: ppublish

Résumé

This paper presents a method to search for the worst-case configuration leading to the highest RF exposure for a multiconfiguration implantable fixation system under MRI. A two-step method combining an artificial neural network and a genetic algorithm is developed to achieve this purpose. In the first step, the level of RF exposure in terms of peak 1-g and/or 10-g averaged specific absorption rate (SAR The presented method can effectively identify the worst-case configuration and accurately predict the SAR The combination of an artificial neural network with genetic algorithm is a robust technique to determine the worst-case RF exposure level for a multiconfiguration system, and only needs a small amount of training data from the entire system.

Identifiants

pubmed: 32459032
doi: 10.1002/mrm.28319
doi:

Types de publication

Journal Article Research Support, U.S. Gov't, Non-P.H.S.

Langues

eng

Sous-ensembles de citation

IM

Pagination

2754-2764

Informations de copyright

© 2020 International Society for Magnetic Resonance in Medicine.

Références

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Auteurs

Jianfeng Zheng (J)

Department of Electrical and Computer Engineering, University of Houston, Houston, Texas, USA.

Qianlong Lan (Q)

Department of Electrical and Computer Engineering, University of Houston, Houston, Texas, USA.

Wolfgang Kainz (W)

Center for Devices and Radiological Health, Food and Drug Administration, Rockville, Maryland, USA.

Stuart A Long (SA)

Department of Electrical and Computer Engineering, University of Houston, Houston, Texas, USA.

Ji Chen (J)

Department of Electrical and Computer Engineering, University of Houston, Houston, Texas, USA.

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Classifications MeSH