Analysis of corrected Cerenkov emission during electron radiotherapy by Monte Carlo method.


Journal

Applied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine
ISSN: 1872-9800
Titre abrégé: Appl Radiat Isot
Pays: England
ID NLM: 9306253

Informations de publication

Date de publication:
Feb 2021
Historique:
received: 24 10 2019
revised: 09 10 2020
accepted: 15 10 2020
entrez: 4 3 2021
pubmed: 5 3 2021
medline: 9 11 2021
Statut: ppublish

Résumé

Cerenkov emission during electron radiotherapy had been emerging as a new dose assessment approach for clinical radiotherapy and could be imaged through a standard commercial camera. The purpose of this work aimed to study the accuracy of corrected Cerenkov emission method during electron radiotherapy by Monte Carlo (MC) method. GAMOS MC software was used to model the physics of electron therapy and calculated dose and Cerenkov photon distribution in water phantom. Compared to ionization chamber and diode measurement, MC simulated dose discrepancy was less than 1% in percentage depth dose (PDD) curves and less than. 2% in crossline profile curves, which was acceptable for clinical criterion. Compared to ionization chamber dose measurement, MC simulated Cerenkov discrepancy was less than 2% in crossline profile distribution, which was acceptable for clinical criterion. However, the Cerenkov PDD curves tended to overestimate the dose at the build-up region and underestimate the dose at the remaining attenuation region. After increasing the Cerenkov distribution depth to 2-3 mm, the discrepancy became well within 1% at the remaining attenuation region, which was acceptable for clinical criterion. Therefore, corrected Cerenkov emission could be used to assess PDD accuracy and crossline profile accuracy during electron radiotherapy.

Identifiants

pubmed: 33658131
pii: S0969-8043(20)30624-2
doi: 10.1016/j.apradiso.2020.109481
pii:
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

109481

Informations de copyright

Copyright © 2020 Elsevier Ltd. All rights reserved.

Auteurs

Yi Li (Y)

State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an, 710119, China; School of Physics, Xi'an Jiaotong University, Xi'an, 710049, China; University of Chinese Academy of Science, Beijing, 100084, China.

Hongjun Liu (H)

State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an, 710119, China; Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan, 030006, China. Electronic address: liuhongjun@opt.ac.cn.

Nan Huang (N)

State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an, 710119, China.

Zhaolu Wang (Z)

State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an, 710119, China.

Chunmin Zhang (C)

School of Physics, Xi'an Jiaotong University, Xi'an, 710049, China. Electronic address: zcm@xjtu.edu.cn.

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Classifications MeSH