Combining X-ray excited optical luminescence and X-ray absorption spectroscopy for correlative imaging on the nanoscale.


Journal

Journal of synchrotron radiation
ISSN: 1600-5775
Titre abrégé: J Synchrotron Radiat
Pays: United States
ID NLM: 9888878

Informations de publication

Date de publication:
01 Nov 2021
Historique:
received: 11 05 2021
accepted: 10 09 2021
entrez: 5 11 2021
pubmed: 6 11 2021
medline: 10 11 2021
Statut: ppublish

Résumé

X-ray absorption and optical luminescence can both provide valuable but very different information on the chemical and physical properties of materials. Although it is known that the spectral characteristics of many materials are highly heterogeneous on the micro- and/or nanoscale, no methodology has so far been shown to be capable of spatially resolving both full X-ray absorption and X-ray excited optical luminescence (XEOL) spectra on the nanoscale in a correlative manner. For this purpose, the scanning transmission X-ray microscope at the HERMES beamline of the SOLEIL synchrotron was equipped with an optical detection system capable of recording high-resolution XEOL spectra using a 40 nm soft X-ray probe. The functionality of the system was demonstrated by analyzing ZnO powder dispersions - showing simultaneously the X-ray linear dichroism and XEOL behavior of individual submicrometric ZnO crystallites.

Identifiants

pubmed: 34738940
pii: S1600577521009450
doi: 10.1107/S1600577521009450
pmc: PMC8570211
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

1858-1864

Informations de copyright

open access.

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Auteurs

Selwin Hageraats (S)

Conservation and Science, Rijksmuseum Amsterdam, PO Box 74888, 1070 DN Amsterdam, The Netherlands.

Katrien Keune (K)

Conservation and Science, Rijksmuseum Amsterdam, PO Box 74888, 1070 DN Amsterdam, The Netherlands.

Stefan Stanescu (S)

Synchrotron SOLEIL, 91192 Gif-Sur-Yvette, France.

Jean Michel Laurent (JM)

Andor Technology, Springvale Business Park, 7 Millennium Way, Belfast BT12 7AL, United Kingdom.

William Fresquet (W)

Andor Technology, Springvale Business Park, 7 Millennium Way, Belfast BT12 7AL, United Kingdom.

Mathieu Thoury (M)

IPANEMA, CNRS, Ministère de la Culture et de la Communication, Université de Versailles Saint-Quentin-en-Yvelines, USR 3461, Université Paris-Saclay, 91128 Gif-sur-Yvette, France.

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Classifications MeSH