Microscopes, tools, probes, and protocols: A guide in the route of correlative microscopy for biomedical investigation.

3D Confocal microscopy Correlative microscopy Electron microscopy FIB-SEM Light microscopy Micro-CT Probes Protocols SEM Sample preparation TEM Ultrastructure X-ray microscopy

Journal

Micron (Oxford, England : 1993)
ISSN: 1878-4291
Titre abrégé: Micron
Pays: England
ID NLM: 9312850

Informations de publication

Date de publication:
01 2022
Historique:
received: 28 06 2021
revised: 12 11 2021
accepted: 14 11 2021
pubmed: 22 11 2021
medline: 15 12 2021
entrez: 21 11 2021
Statut: ppublish

Résumé

In the last decades, the advancements of microscopes technology, together with the development of new imaging approaches, are trying to address some biological questions that have been unresolved in the past: the need to combine in the same analysis temporal, functional and morphological information on the biological sample has become pressing. For this reason, the use of correlative microscopy, in which two or more imaging techniques are combined in the same analysis, is getting increasingly widespread. In fact, correlative microscopy can overcome limitations of a single imaging method, giving access to a larger amount of information from the same specimen. However, correlative microscopy can be challenging, and appropriate protocols for sample preparation and imaging methods must be selected. Here we review the state of the art of correlating electron microscopy with different imaging methods, focusing on sample preparation, tools, and labeling methods, with the aim to provide a comprehensive guide for those scientists who are approaching the field of correlative methods.

Identifiants

pubmed: 34801960
pii: S0968-4328(21)00173-6
doi: 10.1016/j.micron.2021.103182
pii:
doi:

Types de publication

Journal Article Review

Langues

eng

Sous-ensembles de citation

IM

Pagination

103182

Informations de copyright

Copyright © 2021 Elsevier Ltd. All rights reserved.

Auteurs

Paola Parlanti (P)

Istituto Italiano di Tecnologia, Center for Materials Interfaces, Electron Crystallography, Viale Rinaldo Piaggio 34, I-56025, Pontedera (PI), Italy. Electronic address: paola.parlanti@iit.it.

Valentina Cappello (V)

Istituto Italiano di Tecnologia, Center for Materials Interfaces, Electron Crystallography, Viale Rinaldo Piaggio 34, I-56025, Pontedera (PI), Italy. Electronic address: valentina.cappello@iit.it.

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Classifications MeSH