The Role of Hydrogen Incorporation into Amorphous Carbon Films in the Change of the Secondary Electron Yield.
Raman spectroscopy
SEY
XPS
amorphous carbon
particle accelerators
Journal
International journal of molecular sciences
ISSN: 1422-0067
Titre abrégé: Int J Mol Sci
Pays: Switzerland
ID NLM: 101092791
Informations de publication
Date de publication:
20 Aug 2023
20 Aug 2023
Historique:
received:
17
07
2023
revised:
10
08
2023
accepted:
18
08
2023
medline:
28
8
2023
pubmed:
26
8
2023
entrez:
26
8
2023
Statut:
epublish
Résumé
Over the last few years, there has been increasing interest in the use of amorphous carbon thin films with low secondary electron yield (SEY) to mitigate electron multipacting in particle accelerators and RF devices. Previous works found that the SEY increases with the amount of incorporated hydrogen and correlates with the Tauc gap. In this work, we analyse films produced by magnetron sputtering with different contents of hydrogen and deuterium incorporated via the target poisoning and sputtering of C
Identifiants
pubmed: 37629181
pii: ijms241612999
doi: 10.3390/ijms241612999
pmc: PMC10456004
pii:
doi:
Substances chimiques
Deuterium
AR09D82C7G
Graphite
7782-42-5
Hydrogen
7YNJ3PO35Z
Soot
0
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Références
Philos Trans A Math Phys Eng Sci. 2004 Nov 15;362(1824):2477-512
pubmed: 15482988
Nat Nanotechnol. 2013 Apr;8(4):235-46
pubmed: 23552117
Phys Rev B Condens Matter. 1986 Sep 15;34(6):4289-4297
pubmed: 9940199