Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers.
X-ray free-electron laser
X-ray intensity monitor
diagnostics
Journal
Journal of synchrotron radiation
ISSN: 1600-5775
Titre abrégé: J Synchrotron Radiat
Pays: United States
ID NLM: 9888878
Informations de publication
Date de publication:
01 Mar 2019
01 Mar 2019
Historique:
received:
12
09
2018
accepted:
31
01
2019
entrez:
12
3
2019
pubmed:
12
3
2019
medline:
13
4
2019
Statut:
ppublish
Résumé
For LCLS-II, a fluorescence intensity monitor for the non-invasive, pulse-by-pulse normalization of experiments has been developed. A prototype diagnostic was constructed with a microchannel plate assembly and two photodiodes. The diagnostic was then installed in the LCLS SXR instrument Kirkpatrick-Baez mirror chamber with the detectors located above the vertically reflecting mirror. The linearity, noise and position sensitivity of the detectors have been characterized. The photodiode responsivity is suitable for high pulse energies. The microchannel plate detector shows sufficient responsivity over a wide range of pulse energies. The relative signal from the two photodiodes provides a sensitive measure of the X-ray beam position. The fluorescence intensity monitor provides intensity normalization while being compatible with high incident power, a 0.93 MHz repetition rate and ultra-high vacuum.
Identifiants
pubmed: 30855243
pii: S1600577519001802
doi: 10.1107/S1600577519001802
pmc: PMC6412172
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
358-362Subventions
Organisme : U.S. Department of Energy, Office of Science
ID : DE-AC02-76SF00515
Informations de copyright
open access.
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