DNA Origami Fiducial for Accurate 3D Atomic Force Microscopy Imaging.

AFM DNA origami atomic force microscopy image correction tip reconstruction

Journal

Nano letters
ISSN: 1530-6992
Titre abrégé: Nano Lett
Pays: United States
ID NLM: 101088070

Informations de publication

Date de publication:
22 02 2023
Historique:
medline: 18 4 2023
pubmed: 7 2 2023
entrez: 6 2 2023
Statut: ppublish

Résumé

Atomic force microscopy (AFM) is a powerful technique for imaging molecules, macromolecular complexes, and nanoparticles with nanometer resolution. However, AFM images are distorted by the shape of the tip used. These distortions can be corrected if the tip shape can be determined by scanning a sample with features sharper than the tip and higher than the object of interest. Here we present a 3D DNA origami structure as fiducial for tip reconstruction and image correction. Our fiducial is stable under a broad range of conditions and has sharp steps at different heights that enable reliable tip reconstruction from as few as ten fiducials. The DNA origami is readily codeposited with biological and nonbiological samples, achieves higher precision for the tip apex than polycrystalline samples, and dramatically improves the accuracy of the lateral dimensions determined from the images. Our fiducial thus enables accurate and precise AFM imaging for a broad range of applications.

Identifiants

pubmed: 36745573
doi: 10.1021/acs.nanolett.2c04299
pmc: PMC9951250
doi:

Substances chimiques

DNA 9007-49-2

Types de publication

Journal Article Research Support, Non-U.S. Gov't

Langues

eng

Sous-ensembles de citation

IM

Pagination

1236-1243

Auteurs

Pauline J Kolbeck (PJ)

Department of Physics and Center for NanoScience, LMU Munich, Amalienstrasse 54, 80799Munich, Germany.
Department of Physics and Debye Institute for Nanomaterials Science, Utrecht University, Princetonplein 1, 3584 CCUtrecht, The Netherlands.

Mihir Dass (M)

Department of Physics and Center for NanoScience, LMU Munich, Amalienstrasse 54, 80799Munich, Germany.

Irina V Martynenko (IV)

Department of Physics and Center for NanoScience, LMU Munich, Amalienstrasse 54, 80799Munich, Germany.

Relinde J A van Dijk-Moes (RJA)

Department of Physics and Debye Institute for Nanomaterials Science, Utrecht University, Princetonplein 1, 3584 CCUtrecht, The Netherlands.

Kelly J H Brouwer (KJH)

Department of Physics and Debye Institute for Nanomaterials Science, Utrecht University, Princetonplein 1, 3584 CCUtrecht, The Netherlands.

Alfons van Blaaderen (A)

Department of Physics and Debye Institute for Nanomaterials Science, Utrecht University, Princetonplein 1, 3584 CCUtrecht, The Netherlands.

Willem Vanderlinden (W)

Department of Physics and Center for NanoScience, LMU Munich, Amalienstrasse 54, 80799Munich, Germany.
Department of Physics and Debye Institute for Nanomaterials Science, Utrecht University, Princetonplein 1, 3584 CCUtrecht, The Netherlands.

Tim Liedl (T)

Department of Physics and Center for NanoScience, LMU Munich, Amalienstrasse 54, 80799Munich, Germany.

Jan Lipfert (J)

Department of Physics and Center for NanoScience, LMU Munich, Amalienstrasse 54, 80799Munich, Germany.
Department of Physics and Debye Institute for Nanomaterials Science, Utrecht University, Princetonplein 1, 3584 CCUtrecht, The Netherlands.

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Classifications MeSH